Accel-RF所推出的射频特性测试平台，针对大功率器件的直流，射频，温度等特性进行加速老化测试。

产品特色：

A single system to simultaneously

– Determine life expectancy of compound semiconductor components

– Characterize components during test to show RF and DC degradation

Multidimensional Dynamic Testing

– Automatically perform 3-temperature life tests

– Automatically characterize components

Stimulate each DUT with …

– RF

• Independent RF drive level for each DUT

• Frequency ranges to 18 GHz @ up to 10W

– DC

• Two independent bias sources (up to 100V, 3A @ 60W max)

• Bias can be constant voltage or constant current sources

– Temperature

• Independent “Channe”l or “Surface” temp control for each DUT

• +50ºC to +250ºC